Workshop Committee

General Chair
Peter Raad, South. Methodist U., USA

Vice General Chair
Marta Rencz, BME, Budapest, Hungary

Programme Chair
Bernhard Wunderle, TU Chemnitz, Germany

Vice Programme Chair
Andras Poppe, BME, Budapest, Hungary

Steering Committee
M. Rencz, BME, Budapest, Hungary (chair)
B. Courtois, CMP, France
J. Janssen, NXP Semiconductors, Nijmegen, Netherlands
A. Napieralski, TU Lodz, Poland
J. Parry, Mentor Graphics, UK
P. Raad, SMU, USA
A. Rubio, U. Politècnica de Catalunya, Spain
B. Wunderle, TU Chemnitz, Germany

Programme Committee

Name Company
J . Altet U. Politècnica de Catalunya, Spain
M. Abo Ras Berliner Nanotest und Design GmbH
T. Baba Nat. Metrology Institute Tsukuba, Japan
I. Barsony Institute for Technical Physics and Materials Science (MFA)
S. Bouwstra MEMS Technical Consultancy, Amsterdam, The Netherlands
K. Chakrabarty Duke, USA
O. Chapuis CIN2-CSIC, Barcelona, Spain
L. Codecasa Polit. di Milano, Italy
A. Daniel Intel, USA
R. Egawa Tohoku U., Japan
V. Eveloy The Petroleum Inst., UAE
S. Garimella Purdue U, West Lafayette, USA
Y. C. Gerstenmaier Siemens, Germany
A. Glezer The Georgia Institute of Technology, USA
A. Gupta Freescale Semiconductor Inc., Austin, USA
J. Janssen NXP Semiconductors, Nijmegen, The Netherlands
X. Jorda Centro Nacional de Microelectronica, Spain
J. Keller AMIC Angewandte Micro-Messtechnik GmbH, Germany
W. Luiten Philips Applied Technologies, Eindhoven, The Netherlands
W. C. Maia THALES-EPM, Meudon-la-Foret, France
B. Michel Fraunhofer Institute for Electronic Nanosystems – ENAS, Germany
B. Michel IBM Zurich, Rueschlikon, Switzerland
A. Napieralski TU Lodz, Poland
H. Oppermann Fraunhofer Institute for Reliabilty and Microintegration - IZM, Germany
X. Perpina Centro Nacional de Microelectrónica, Spain
T. Persoons Purdue University, USA
P. Rodgers The Petroleum Inst., UAE
A. Rubio U. Politècnica de Catalunya, Spain
S. Sapatnekar U. of Minnesota, USA
R. Schacht Lausitz University of Applied Science (FH), Germany
D. Schweitzer Infineon Technologies AG
Y. Scudeller E.Polytech. U. Nantes, France
A. Shakouri Purdue University, USA
E. Suhir UC Santa Cruz, USA
A. Tay NUS, Singapore
V. Tsoi Huawei Technologies Sweden
B. Vandevelde IMEC, Belgium
S. Volz Ecole Centrale Paris, France
G. Wachutka TU München, Germany
J. Yu Philips Research, The Netherlands
T. Zahner OSRAM, Germany