International Workshop on |
THERMal INvestigations of ICs and Systems
THERMAL STRESS FAILURES IN MICROELECTRONICS PACKAGING:
PREDICTIVE MODELING AND PREVENTION
Bell Laboratories, Physical Sciences and Engineering Research Division,
Murray Hill, New Jersey, USA
A tutorial is being offered on Sunday 24 September, from 9.30 a.m. to 5 p.m.. Registrations will be guarantied on a first come first serve basis, upon maximum capacity is reached.
SCOPE / OBJECTIVES:
The course will be taught with the emphasis on the physics of the phenomena, stresses and failures. No in-depth knowledge of the mechanical, materials or structural engineering is required.
Dr. E. Suhir is Distinguished Member of Technical (Research) Staff at Bell Laboratories, Physical Sciences and Engineering Research Division. He is Technical Editor of the ASME Journal of Electronic Packaging. Dr. Suhir is Fellow of the Institute of Electrical and Electronics Engineers (IEEE), American Society of Mechanical Engineers (ASME) and the Society of Plastics Engineers (SPE) and Senior Member of the American Physical Society (APS). He is Distinguished Lecturer with IEEE and ASME. Dr. Suhir has authored more than 200 papers, patents, book chapters and books on mechanics and reliability of microelectronics and photonics materials, packages and systems. He received numerous professional and distinguished services awards, including the 1999 National Tau Pi Sigma and ASME Charles Russ Richards Memorial award for outstanding contributions to mechanical engineering, the 2000 IEEE-CPMT award for outstanding pioneering, sustained and continuing contributions to the fields Materials and Mechanical Engineering related to microelectronics and fiber-optics packages and structures, and the 2000 International SPE Fred O. Conley Award for outstanding contributions to plastics engineering and technology. Dr. Suhir organized many successful conferences, symposia and workshops on microelectronic and photonic materials, packages and structures.
Copyright © 2000 Laboratoire TIMA.
Tous droits réservés.